Recently added

Characterisation of nanoscaled interdigitated palladium electrodes of various dimensions for biosensing

Laureyn, Wim; Van Gerwen, Peter; Suls, Jan; Jacobs, Philippe; Maes, Guido (2000)

Physico-chemical study of probe immobilisations for immunosensing applications

Laureyn, Wim; Frederix, Filip; Köhn, F.; Hellin, David; Ceulemans, Griet; Maes, Guido (2000)

A comparative study of copper drift diffusion in plasma deposited A-Sic:H and silicon nitride

Lanckmans, Filip; Gray, William; Brijs, Bert; Maex, Karen (2000)

A quantitative study of the adhesion between copper, barrier and organic low-k polymers

Lanckmans, Filip; Brongersma, Sywert; Varga, Istvan; Beyne, Eric; Maex, Karen (2000)

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS

Kollmer, F.; Kamischke, R.; Ostendorf, R.; Bender, Hugo; Benninghoven, A. (2000)

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS

Kollmer, F.; Kamischke, R.; Ostendorf, R.; Bender, Hugo; Benninghoven, A. (2000)

Presentations of MPEG tutorial at IBC 2000

Koenen, R.; Bormans, Jan; Hill, K.; Kim, M.; Ohm, J. R.; Salembier, P. (2000)

Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons

Kobayashi, K.; Ohyama, Hidenori; Hayama, Kiyoteru; Takami, Y.; Simoen, Eddy; Poyai, Amporn; Claeys, C. (2000)

Orthonormal Riemann filter systems

Knockaert, Luc (2000)

Combining TOFSIMS with XPS and AFM to quantify organic surface coverages

Kenens, Conny; Conard, Thierry; Vandervorst, Wilfried (2000)

Linear arrays of poly SiGe uncolled microbolometers with CMOS readout as long wavelength infrared sensors

Kavadias, Spyros; De Moor, Piet; Gastal, Martin; Van Hoof, Chris (2000)

A hybrid long wavelength IR sensor based on a linear array of poly-SiGe uncooled microbolometers with a CMOS readout

Kavadias, Spyros; De Moor, Piet; Gastal, Martin; Hendrickx, N.; Wirix, Filip; Van Hoof, Chris (2000)

An update on the SEMI standards mask qualification terminology task force

Jonckheere, Rik (2000)

Application of zinc porphyrin pentamer in polymer light emitting diodes

Jin, Yadong; Asokan, C. V.; Smeets, S.; Heremans, Paul; Dehaen, W.; Van der Auweraer, M.; Geise, H. J.; Borghs, Gustaaf (2000)

Sputtering yield: Si and SiGe under O2-bombardment

Janssens, Tom; Vandervorst, Wilfried (2000)

In-situ characterization of the oxidation degree of the sputter surface and the oxygen enhancement of the ionization probability of Si

Janssens, Tom; Vandervorst, Wilfried (2000)

Space charge limited currents in a doped and depleted conducting organic material

Jain, Suresh; Geens, Wim; Poortmans, Jef; Mertens, Robert; Willander, M. (2000)

Build-up of the altered layer as function of the ion-fluency in Si-Ge

Huyghebaert, Cedric; Brijs, Bert; Vandervorst, Wilfried (2000)

In situ HDP-CVD process monitoring based on quadrupole mass spectrometry

Hughes, Carolyn; Van Hoeymissen, Jan; Heyns, Marc (2000)

Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers

Houssa, Michel; Degraeve, Robin; Heyns, Marc; Kaczer, Ben; Groeseneken, Guido; Naili, Mohamed; Mertens, Paul; Stesmans, Andre; Jeon, J. S.; Halliyal, A. (2000)

Presentations: Recent submissions

Characterisation of nanoscaled interdigitated palladium electrodes of various dimensions for biosensing ﻿

Physico-chemical study of probe immobilisations for immunosensing applications ﻿

A comparative study of copper drift diffusion in plasma deposited A-Sic:H and silicon nitride ﻿

A quantitative study of the adhesion between copper, barrier and organic low-k polymers ﻿

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS ﻿

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS ﻿

Presentations of MPEG tutorial at IBC 2000 ﻿

Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons ﻿

Orthonormal Riemann filter systems ﻿

Combining TOFSIMS with XPS and AFM to quantify organic surface coverages ﻿

Linear arrays of poly SiGe uncolled microbolometers with CMOS readout as long wavelength infrared sensors ﻿

A hybrid long wavelength IR sensor based on a linear array of poly-SiGe uncooled microbolometers with a CMOS readout ﻿

An update on the SEMI standards mask qualification terminology task force ﻿

Application of zinc porphyrin pentamer in polymer light emitting diodes ﻿

Sputtering yield: Si and SiGe under O2-bombardment ﻿

In-situ characterization of the oxidation degree of the sputter surface and the oxygen enhancement of the ionization probability of Si ﻿

Space charge limited currents in a doped and depleted conducting organic material ﻿

Build-up of the altered layer as function of the ion-fluency in Si-Ge ﻿

In situ HDP-CVD process monitoring based on quadrupole mass spectrometry ﻿

Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers ﻿

Characterisation of nanoscaled interdigitated palladium electrodes of various dimensions for biosensing

Physico-chemical study of probe immobilisations for immunosensing applications

A comparative study of copper drift diffusion in plasma deposited A-Sic:H and silicon nitride

A quantitative study of the adhesion between copper, barrier and organic low-k polymers

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS

Elemental mapping of sub-μm particles and structures by laser-SNMS and TOF-SIMS

Presentations of MPEG tutorial at IBC 2000

Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons

Orthonormal Riemann filter systems

Combining TOFSIMS with XPS and AFM to quantify organic surface coverages

Linear arrays of poly SiGe uncolled microbolometers with CMOS readout as long wavelength infrared sensors

A hybrid long wavelength IR sensor based on a linear array of poly-SiGe uncooled microbolometers with a CMOS readout

An update on the SEMI standards mask qualification terminology task force

Application of zinc porphyrin pentamer in polymer light emitting diodes

Sputtering yield: Si and SiGe under O2-bombardment

In-situ characterization of the oxidation degree of the sputter surface and the oxygen enhancement of the ionization probability of Si

Space charge limited currents in a doped and depleted conducting organic material

Build-up of the altered layer as function of the ion-fluency in Si-Ge

In situ HDP-CVD process monitoring based on quadrupole mass spectrometry

Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers