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Radiation-induced degradation effects in CMOS active pixel sensors and design of a radiation-tolerant image sensor

dc.contributor.authorBogaerts, Jan
dc.date.accessioned2021-10-14T21:09:59Z
dc.date.available2021-10-14T21:09:59Z
dc.date.issued2002-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6036
dc.sourceIIOimport
dc.titleRadiation-induced degradation effects in CMOS active pixel sensors and design of a radiation-tolerant image sensor
dc.typePHD thesis
dc.source.peerreviewno
dc.contributor.thesisadvisorMertens, Robert
imec.availabilityPublished - imec


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