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High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems

dc.contributor.authorMöller, A.
dc.contributor.authorTrenkler, Thomas
dc.contributor.authorWenzel, C.
dc.contributor.authorDrescher, K.
dc.date.accessioned2021-09-29T13:11:46Z
dc.date.available2021-09-29T13:11:46Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/774
dc.sourceIIOimport
dc.titleHigh Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conference1st European Workshop on Materials for Advanced Metallization; March 19-22, 1995; Radebeul, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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