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Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.date.accessioned2021-09-29T12:40:10Z
dc.date.available2021-09-29T12:40:10Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/80
dc.sourceIIOimport
dc.titleInterface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference1st ELEN Workshop on Noise in Electronic Systems
dc.source.conferencedate18/10/1994
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


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