Show simple item record

Scanning spreading resistance microscopy: high resolution two-dimensional carrier profiling of semiconductor structures

dc.contributor.authorEyben, Pierre
dc.date.accessioned2021-10-15T13:22:56Z
dc.date.available2021-10-15T13:22:56Z
dc.date.issued2004-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8894
dc.sourceIIOimport
dc.titleScanning spreading resistance microscopy: high resolution two-dimensional carrier profiling of semiconductor structures
dc.typePHD thesis
dc.contributor.imecauthorEyben, Pierre
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorVandervorst, Wilfried
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
9744.pdf
Size:
12.78Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record