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Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry

dc.contributor.authorViapiana, Matteo
dc.contributor.authorWouters, Dirk
dc.contributor.authorMaes, Herman
dc.contributor.authorVan der Biest, Omer
dc.date.accessioned2021-10-15T17:42:17Z
dc.date.available2021-10-15T17:42:17Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9879
dc.sourceIIOimport
dc.titleDependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium D: Functional Oxides for Advanced Semiconductor Technologies
dc.source.conferencedate24/05/2004
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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