Recently added

ALCVD hafnium silicates for low power gate stacks

Maes, Jan; Laitinen, O.; De Witte, Hilde; Deweerd, Wim; Delabie, Annelies; Conard, Thierry; Brijs, Bert; Wang, C. - G.; Velasco, H.; Wilk, G. (2004)

IMEC's approach to reconcile its dual mission of global excellence and support of local innovation

Maes, Herman (2004)

IMEC's approach to reconcile its dual mission of global research excellence and support of local innovation

Maes, Herman (2004)

Integration of MOCVD SBT stacked ferroelectric capacitors in A 0.35um CMOS technology

Maes, David; Everaert, Jean-Luc; Goux, Ludovic; Lisoni, Judit; Paraschiv, Vasile; Schuster, Thomas; Haspeslagh, Luc; Wouters, Dirk; Artoni, C.; Caputa, Concetta; Casella, P.; Corallo, G.; Russo, G.; Zambrano, R.; Monchoix, H.; Van Autryve, Luc (2004)

The role of internal dislocation sources for the strain ralaxation of pseudomorphic SiGe/Si structures

Luysberg, Martina; Hueging, Norbert; Lenk, Steffi; Buca, Dan; Hollaender, Bernd; Mantl, Siegfried; Marcio, J; Fichtner, Paulo; Loo, Roger; Caymax, Matty (2004)

Untersuchung der Heliumimplantation als Schlüsselprozess in der Relaxtion von pseudomorphischen SiGe/Si Heterostrukturen

Luysberg, M.; Buca, D.; Mantl, S.; Morschbacher, M.; Fichner, P.; Loo, Roger; Caymax, Matty; Urban, K.; Hueging, N. (2004)

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs

Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2004)

Pacwoman paving the way for the fourth generation: a new family of wirless personal area networks

Louagie, Filip (2004)

Determining the impact of statistical fluctuations on resist line edge roughness

Leunissen, Peter; Ercken, Monique; Patsis, George P. (2004)

Future R&D strategy in embedded systems

Lauwereins, Rudy (2004)

Ubiquitous networks including wireless

Lauwereins, Rudy (2004)

Realizing an ambient intelligent environment: vision, challenges and solutions

Lauwereins, Rudy (2004)

Challenges and opportunities posed by coarse grain reconfigurable computing

Lauwereins, Rudy (2004)

System level design technology for realizing an ambient intelligent environment

Lauwereins, Rudy (2004)

Patternable silicones for next generation packaging reliability requirements

Kunselman, Michael; Larson, Lyndon; Harkness, Brian; Gardner, Geoff; Alger, James; Cummings, Michelle; Meynen, Herman; Gonzalez, Mario; Vandevelde, Bart; Vanden Bulcke, Mathieu; Winters, Christophe; Beyne, Eric (2004)

Optical label switched networks - the FP5-IST STOLAS project

Koonen, Ton; Monroy Tafur, Idelfonso; Van der Tol, Jos; Zouganelli, Evi; Cheyns, Jan; Morthier, Geert; Jennen, Jean; Peucheret, Christophe; Mullane, Tommy; Blidegn, Kristian; Raaby, Peter (2004)

On the radiation damage effects in semiconductors beyond the end of range of implanted protons at high energies and fluences

Kokkoris, M.; Spyroua, A.; Perdikakisa, G.; Lagoyannis, A.; Papadopoulos, C.T.; Vlastou Zannia, R.; Simoen, Eddy; Kossionides, S. (2004)

Presentations: Recent submissions

ALCVD hafnium silicates for low power gate stacks

IMEC's approach to reconcile its dual mission of global excellence and support of local innovation

IMEC's approach to reconcile its dual mission of global research excellence and support of local innovation

Integration of MOCVD SBT stacked ferroelectric capacitors in A 0.35um CMOS technology

The role of internal dislocation sources for the strain ralaxation of pseudomorphic SiGe/Si structures

Untersuchung der Heliumimplantation als Schlüsselprozess in der Relaxtion von pseudomorphischen SiGe/Si Heterostrukturen

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs

Pacwoman paving the way for the fourth generation: a new family of wirless personal area networks

Determining the impact of statistical fluctuations on resist line edge roughness

Future R&D strategy in embedded systems

Ubiquitous networks including wireless

Realizing an ambient intelligent environment: vision, challenges and solutions

Challenges and opportunities posed by coarse grain reconfigurable computing

System level design technology for realizing an ambient intelligent environment

Patternable silicones for next generation packaging reliability requirements

Optical label switched networks - the FP5-IST STOLAS project

On the radiation damage effects in semiconductors beyond the end of range of implanted protons at high energies and fluences

Effect of chemical solution on the stability of low-k films

Impact of enhanced localized degradation on time-to-breakdown in high-k oxides

The influence of recovery and temperature on the NBTI power-law exponent

Presentations: Recent submissions

ALCVD hafnium silicates for low power gate stacks ﻿

IMEC's approach to reconcile its dual mission of global excellence and support of local innovation ﻿

IMEC's approach to reconcile its dual mission of global research excellence and support of local innovation ﻿

Integration of MOCVD SBT stacked ferroelectric capacitors in A 0.35um CMOS technology ﻿

The role of internal dislocation sources for the strain ralaxation of pseudomorphic SiGe/Si structures ﻿

Untersuchung der Heliumimplantation als Schlüsselprozess in der Relaxtion von pseudomorphischen SiGe/Si Heterostrukturen ﻿

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs ﻿

Pacwoman paving the way for the fourth generation: a new family of wirless personal area networks ﻿

Determining the impact of statistical fluctuations on resist line edge roughness ﻿

Future R&D strategy in embedded systems ﻿

Ubiquitous networks including wireless ﻿

Realizing an ambient intelligent environment: vision, challenges and solutions ﻿

Challenges and opportunities posed by coarse grain reconfigurable computing ﻿

System level design technology for realizing an ambient intelligent environment ﻿

Patternable silicones for next generation packaging reliability requirements ﻿

Optical label switched networks - the FP5-IST STOLAS project ﻿

On the radiation damage effects in semiconductors beyond the end of range of implanted protons at high energies and fluences ﻿

Effect of chemical solution on the stability of low-k films ﻿

Impact of enhanced localized degradation on time-to-breakdown in high-k oxides ﻿

The influence of recovery and temperature on the NBTI power-law exponent ﻿

ALCVD hafnium silicates for low power gate stacks

IMEC's approach to reconcile its dual mission of global excellence and support of local innovation

IMEC's approach to reconcile its dual mission of global research excellence and support of local innovation

Integration of MOCVD SBT stacked ferroelectric capacitors in A 0.35um CMOS technology

The role of internal dislocation sources for the strain ralaxation of pseudomorphic SiGe/Si structures

Untersuchung der Heliumimplantation als Schlüsselprozess in der Relaxtion von pseudomorphischen SiGe/Si Heterostrukturen

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs

Pacwoman paving the way for the fourth generation: a new family of wirless personal area networks

Determining the impact of statistical fluctuations on resist line edge roughness

Future R&D strategy in embedded systems

Ubiquitous networks including wireless

Realizing an ambient intelligent environment: vision, challenges and solutions

Challenges and opportunities posed by coarse grain reconfigurable computing

System level design technology for realizing an ambient intelligent environment

Patternable silicones for next generation packaging reliability requirements

Optical label switched networks - the FP5-IST STOLAS project

On the radiation damage effects in semiconductors beyond the end of range of implanted protons at high energies and fluences

Effect of chemical solution on the stability of low-k films

Impact of enhanced localized degradation on time-to-breakdown in high-k oxides

The influence of recovery and temperature on the NBTI power-law exponent