Recently added

Power reduction on multi-processor platforms for dynamic concurrent applications

Vounckx, Johan (2003)

MARLOW roadmap - low power applications for 2010

Vounckx, Johan (2003)

An FPGA-based lab test bed for a Gigabit passive optical network

Verschuere, Stefaan; Lou, David; Yi, Yanchun; Verhulst, Dieter; Qiu, Xing Zhi; Vandewege, Jan (2003)

Management architecture supporting QoS in the Internet based on DiffServ

Vermeulen, Brecht; Dhoedt, Bart; Demeester, Piet (2003)

The vapour phase growth of organic semiconductors on inert substrates

Verlaak, Stijn; Steudel, Soeren; Janssen, Dimitri; Deleuze, Michael; Heremans, Paul (2003)

Numerical simulation of organic light-emitting transistors

Verlaak, Stijn; Cheyns, David; Arkhipov, Vladimir; Debucquoy, Maarten; Heremans, Paul (2003)

Charge transport in thin polycrystalline films of organic semiconductors

Verlaak, Stijn; Arkhipov, Vladimir; Heremans, Paul (2003)

Evaluation of megasonic cleaning for particle removal efficiency and damaging

Vereecke, Guy; Holsteyns, Frank; Xu, Kaidong; Lux, Marcel; Vos, Rita; Mertens, Paul; Loper, S.; Grothe, P. (2003)

Cleaning uniformity of silicon wafers in megasonic tanks

Vereecke, Guy; Holsteyns, Frank; Veltens, J.; Vos, Rita; Mertens, Paul (2003)

Premiers résultats de puissance à 4GHz obtenus sur HEMTs AlGaN/GaN en technologie planar

Vellas, N.; Guhel, Y.; Gaquiere, C.; Boudart, B.; Pesant, J.C.; Bougrioua, Z.; Germain, Marianne; de Jaeger, J.C. (2003)

Influence of heat treatment on P3HT based polymer solar cells

Vanlaeke, Peter; Aernouts, Tom; Poortmans, Jef; Heremans, Paul; Borghs, Gustaaf; Mertens, Robert (2003)

Prerequisites and properties of low band gap materials towards photovoltaic applications

Vanderzande, Dirk; Wagner, P.; Nicolas, M.; Heckens, A.; Polec, I.; Lutsen, Laurence (2003)

Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM

Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Alvarez, David; Fouchier, Marc; Xu, Mingwei (2003)

Probing local electrical properties in semiconductors with nanometer resolution

Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Alvarez, David; Xu, Mingwei; Fouchier, Marc; Clarysse, Trudo (2003)

On the sensitivity of carrier illumination to processing steps

Vandervorst, Wilfried; Clarysse, Trudo; Pawlak, Bartek; Budiarto, E.; Borden, Peter (2003)

Physical characterization of ultrathin high k dielectrics

Vandervorst, Wilfried; Brijs, Bert; Bender, Hugo; Conard, Thierry; Petry, Jasmine; Richard, Olivier; Van Elshocht, Sven; Delabie, Annelies; Caymax, Matty; De Gendt, Stefan (2003)

Dopant characterization techniques (atomic and carrier concentration, potential distribution)

Vandervorst, Wilfried (2003)

Spin-injection in semiconductors: materials challenges and de-vice aspects

Van Roy, Wim; Van Dorpe, Pol; Motsnyi, Vasyl; Liu, Zhiyu; Borghs, Gustaaf; De Boeck, Jo (2003)

Ferromagnetic metal-semiconductor interfaces

Van Roy, Wim (2003)

Spin injection & half-metallic materials: NiMnSb and GaMnAs

Van Roy, Wim (2003)

Presentations: Recent submissions

Power reduction on multi-processor platforms for dynamic concurrent applications ﻿

MARLOW roadmap - low power applications for 2010 ﻿

An FPGA-based lab test bed for a Gigabit passive optical network ﻿

Management architecture supporting QoS in the Internet based on DiffServ ﻿

The vapour phase growth of organic semiconductors on inert substrates ﻿

Numerical simulation of organic light-emitting transistors ﻿

Charge transport in thin polycrystalline films of organic semiconductors ﻿

Evaluation of megasonic cleaning for particle removal efficiency and damaging ﻿

Cleaning uniformity of silicon wafers in megasonic tanks ﻿

Premiers résultats de puissance à 4GHz obtenus sur HEMTs AlGaN/GaN en technologie planar ﻿

Influence of heat treatment on P3HT based polymer solar cells ﻿

Prerequisites and properties of low band gap materials towards photovoltaic applications ﻿

Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM ﻿

Probing local electrical properties in semiconductors with nanometer resolution ﻿

On the sensitivity of carrier illumination to processing steps ﻿

Physical characterization of ultrathin high k dielectrics ﻿

Dopant characterization techniques (atomic and carrier concentration, potential distribution) ﻿

Spin-injection in semiconductors: materials challenges and de-vice aspects ﻿

Ferromagnetic metal-semiconductor interfaces ﻿

Spin injection & half-metallic materials: NiMnSb and GaMnAs ﻿