Recently added

State-of-the art cleaning in semiconductor manufacturing

Mertens, Paul; Arnauts, Sophia; Bearda, Twan; Eitoku, Atsuro; Fyen, Wim; Hellin, David; Holsteyns, Frank; Kesters, Els; Kraus, Harald; Lee, Kuntack; Onsia, Bart; Rip, Jens; Schmidt, H.; Snow, Jim; Teerlinck, Ivo; Vereecke, Guy; Vos, Rita; Xu, Kaidong; Heyns, Marc (2003)

Radiation hardness of SBT-based ferroelectric capacitors

Menou, N.; Castagnos, A.-M.; Muller, Ch.; Johnson, J.A; Goux, Ludovic; Wouters, Dirk (2003)

Failure analysis of FeCAP

Menou, N.; Castagnos, A.; Turquat, C.; Muller, C.; Shur, V.Y.; Wouters, Dirk (2003)

High performance digital circuitry for Gigabit PON-networks

Martens, Yves; Bauwelinck, Johan; Ossieur, Peter; Verhulst, Dieter; Qiu, Xing Zhi; Vandewege, Jan (2003)

Operating systems and application design for reconfigurable SoCs

Marescaux, Théodore (2003)

Strain relaxation of SiGe buffers on Si and SOI wafers induced by He+ ion implantation and thermal annealing

Mantl, S.; Holländer, B.; Hüging, N.; Luysberg, M.; Lenk, St.; Hogg, S.M.; Herzog, H.-J.; Hackbarth, T.; Loo, Roger; Bauer, M. (2003)

Optimization of microvia-technology using an excimer laser for application in microelectronics

Manirambona, Boniface; De Baets, Johan; Vervaet, Alfons (2003)

ESD reliability issues in sub-micron CMOS - trends and challenges

Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; De Heyn, Vincent; Daenen, Tom; Groeseneken, Guido (2003)

New copolymers for photovoltaic applications

Lutsen, Laurence; Colladet, K.; Fourier, S.; Nicolas, M.; Vanderzande, Dirk (2003)

Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs

Lukyanchikova, N.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003)

Strained Si and strained SiGe fabrication schemes using (selective) epitaxial growth in a RPCVD system

Loo, Roger; Delhougne, Romain; Meunier-Beillard, Philippe; Caymax, Matty (2003)

Stress evolution in integrated SrBiTa2O9 ferroelectric layers

Lisoni, Judit; Johnson, J.A.; Goux, Ludovic; Wouters, Dirk (2003)

RF CMOS: a designer's dream

Linten, Dimitri; Soens, Charlotte; Ryckwert, J.; Wambacq, Piet; Donnay, Stephane (2003)

Line edge roughness: experimental results related to a two-parameter model

Leunissen, Peter; Lawrence, W.G.; Ercken, Monique (2003)

Polycrystalline SiGe technology for uncooled microbolometer arrays

Leonov, Vladimir; Goessens, Claus; Van Hoof, Chris; Grietens, Bob; Perova, Natalia A.; Malyutenko, Volodymyr (2003)

Wafer level detection of sealing defects

Le, Quoc Toan; Holsteyns, Frank; Iacopi, Francesca; Maex, Karen (2003)

Multi-channel content: lowering risk and cost for new media

Lauwereins, Rudy (2003)

Ubiquitous broadband wireless communication: will it soon become a reality?

Lauwereins, Rudy (2003)

AI: ambient intelligence or another idiocy ?

Lauwereins, Rudy (2003)

Increased Gilbert damping in spin-valve and magnetic tunnel junction devices

Lagae, Liesbet; Eyckmans, Wouter; Wirix-Speetjens, Roel; Hiebert, W.; Borghs, Gustaaf; De Boeck, Jo (2003)

Presentations: Recent submissions

State-of-the art cleaning in semiconductor manufacturing ﻿

Radiation hardness of SBT-based ferroelectric capacitors ﻿

Failure analysis of FeCAP ﻿

High performance digital circuitry for Gigabit PON-networks ﻿

Operating systems and application design for reconfigurable SoCs ﻿

Strain relaxation of SiGe buffers on Si and SOI wafers induced by He+ ion implantation and thermal annealing ﻿

Optimization of microvia-technology using an excimer laser for application in microelectronics ﻿

ESD reliability issues in sub-micron CMOS - trends and challenges ﻿

New copolymers for photovoltaic applications ﻿

Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs ﻿

Strained Si and strained SiGe fabrication schemes using (selective) epitaxial growth in a RPCVD system ﻿

Stress evolution in integrated SrBiTa2O9 ferroelectric layers ﻿

RF CMOS: a designer's dream ﻿

Line edge roughness: experimental results related to a two-parameter model ﻿

Polycrystalline SiGe technology for uncooled microbolometer arrays ﻿

Wafer level detection of sealing defects ﻿

Multi-channel content: lowering risk and cost for new media ﻿

Ubiquitous broadband wireless communication: will it soon become a reality? ﻿

AI: ambient intelligence or another idiocy ? ﻿

Increased Gilbert damping in spin-valve and magnetic tunnel junction devices ﻿

State-of-the art cleaning in semiconductor manufacturing

Radiation hardness of SBT-based ferroelectric capacitors

Failure analysis of FeCAP

High performance digital circuitry for Gigabit PON-networks

Operating systems and application design for reconfigurable SoCs

Strain relaxation of SiGe buffers on Si and SOI wafers induced by He+ ion implantation and thermal annealing

Optimization of microvia-technology using an excimer laser for application in microelectronics

ESD reliability issues in sub-micron CMOS - trends and challenges

New copolymers for photovoltaic applications

Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs

Strained Si and strained SiGe fabrication schemes using (selective) epitaxial growth in a RPCVD system

Stress evolution in integrated SrBiTa2O9 ferroelectric layers

RF CMOS: a designer's dream

Line edge roughness: experimental results related to a two-parameter model

Polycrystalline SiGe technology for uncooled microbolometer arrays

Wafer level detection of sealing defects

Multi-channel content: lowering risk and cost for new media

Ubiquitous broadband wireless communication: will it soon become a reality?

AI: ambient intelligence or another idiocy ?

Increased Gilbert damping in spin-valve and magnetic tunnel junction devices