Recently added

The effective high-level modeling of a 5GHz RF variable gain amplifier

Dobrovolny, Petr; Wambacq, P.; Vandersteen, Gerd; Hauspie, Dries; Donnay, Stephane; Engels, Marc; Bolsens, Ivo (2001)

Influence of recovery time on TCP behaviour

Develder, Chris; Colle, D.; Van Heuven, P.; Van den Berghe, S.; Pickavet, M.; Demeester, P. (2001)

CoSi2 formation using a Ti capping layer - influence of processing conditions on CoSi2 nucleation

Detavernier, C.; Van Meirhaeghe, R.; Maex, Karen (2001)

The influence of TiN on the thermal stability of CoSi2

Detavernier, C.; Ruttens, Gerlinde; Van Meirhaeghe, R.; Maex, Karen (2001)

Development of a low temperature growth regime for GaInNAs

Derluyn, Joff; Patriarche, G.; Moerman, Ingrid (2001)

The use of VTC error resilience for view-dependent texture decoding

Delfosse, Eric; Lafruit, Gauthier (2001)

Filter design methodology controlling the impact on bit error rate performances in WLAN-OFDM tranceivers

Debaillie, Bjorn; Minami, Hideki; Côme, Boris; Eberle, Wolfgang; Donnay, Stephane (2001)

New approaches to increase the efficiency of the electromagnetic modeling of planar RF and microwave circuits

De Zutter, Daniel; Sercu, Jeannick; Dhaene, T. (2001)

Solar cells from multi-crystalline UMG and plasma-purified UMG silicon substrates

De Wolf, Stefaan; Szlufcik, Jozef; Delannoy, Y.; Périchaud, I.; Häßler, C.; Einhaus, Roland (2001)

TOF-SIMS artifact in the analysis of ZrO2/SiO2/Si stacks

De Witte, Hilde; Conard, Thierry; Vandervorst, Wilfried; Gijbels, Renaat (2001)

The increasing importance of the use of ozone in micro-electronics industry

De Smedt, Frank; De Gendt, Stefan; Claes, M.; Heyns, Marc; Vankerckhoven, Hans; Vinckier, Chris (2001)

Novel silicon device architectures

De Meyer, Kristin (2001)

Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current

Czerwinski, A.; Katcki, J.; Ratajczak, J.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor; Ohyama, Hidenori (2001)

TOFSIMS as a monitor for thin film growth

Conard, Thierry; Vandervorst, Wilfried; Pétry, Jasmine; Zhao, Chao; Besling, Wim; Nohira, Hiroshi; Richard, Olivier (2001)

On the use of SF5/Ar/Ga for the analysis of very thin dielectrica with TOFSIMS

Conard, Thierry; Vandervorst, Wilfried (2001)

γ-irradiation hardness of short channel NMOSFETs fabricated in a 0.5 µm SOI technology

Claeys, C.; Simoen, Eddy; Efremov, A.; Litovchenko, V. G.; Evtuth, A.; Kizjak, A.; Rassamakin, J. (2001)

White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Chen, W. M.; McNally, P. J.; Jacobs, Koen; Tuomi, T.; Danilewsky, A. N.; Lowney, D.; Kanatharana, J.; Knuuttila, L.; Riikonen, J. (2001)

Fabrication and characterization of AlGaN/GaN HEMTs

Calle, F.; Monroy, E.; Tirado, J. M.; Ranchal, R.; Jiménez, A.; Palacios, T.; Muñoz, E.; Grajal, J.; Verdú, M.; Sánchez, F. J.; Montojo, M. T.; Bougrioua, Zahia; Moerman, Ingrid (2001)

Grain growth in electroplated copper

Brongersma, Sywert; Kerr, Emma; Vervoort, Iwan; Maex, Karen (2001)

Quantification and depth profiling of a ZrO2 (2nm)/A1203 (1nm) layer with NRA, RBS, HRBS, HERD

Brijs, Bert; Huyghebaert, Cedric; Nauwelaerts, Sophie; Caymax, Matty; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; Lennard, W. N.; Terwagne, G.; Vantomme, Andre (2001)

Presentations: Recent submissions

The effective high-level modeling of a 5GHz RF variable gain amplifier ﻿

Influence of recovery time on TCP behaviour ﻿

CoSi2 formation using a Ti capping layer - influence of processing conditions on CoSi2 nucleation ﻿

The influence of TiN on the thermal stability of CoSi2 ﻿

Development of a low temperature growth regime for GaInNAs ﻿

The use of VTC error resilience for view-dependent texture decoding ﻿

Filter design methodology controlling the impact on bit error rate performances in WLAN-OFDM tranceivers ﻿

New approaches to increase the efficiency of the electromagnetic modeling of planar RF and microwave circuits ﻿

Solar cells from multi-crystalline UMG and plasma-purified UMG silicon substrates ﻿

TOF-SIMS artifact in the analysis of ZrO2/SiO2/Si stacks ﻿

The increasing importance of the use of ozone in micro-electronics industry ﻿

Novel silicon device architectures ﻿

Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current ﻿

TOFSIMS as a monitor for thin film growth ﻿

On the use of SF5/Ar/Ga for the analysis of very thin dielectrica with TOFSIMS ﻿

γ-irradiation hardness of short channel NMOSFETs fabricated in a 0.5 µm SOI technology ﻿

White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN ﻿

Fabrication and characterization of AlGaN/GaN HEMTs ﻿

Grain growth in electroplated copper ﻿

Quantification and depth profiling of a ZrO2 (2nm)/A1203 (1nm) layer with NRA, RBS, HRBS, HERD ﻿