Recently added

MEMS and submicron CMOS

Baert, Kris (2001)

High-level simulation of substrate noise generation in complex digital systems

Badaroglu, Mustafa; Van Heijningen, Marc; Donnay, Stephane (2001)

Transistor optimisation for a low-cost, high-performance 0.13 μm CMOS technology

Augendre, Emmanuel; Kubicek, Stefan; De Keersgieter, An; Mertens, S.; Lindsay, Richard; Verbeeck, Rita; Van Laer, Joris; Dupas, Luc; Badenes, Gonçal (2001)

Band alignment at the interfaces of Al2O3 and ZrO2-based insulators with metals and Si

Afanas'ev, V. V.; Houssa, Michel; Stesmans, Andre; Heyns, Marc (2001)

Optimal guest-host energy transfer from poly N-vinylcarbazole to blue-emitting para-phenylene-vynilene trimers

Aerts, G.; Bouwen, A.; Goovaerts, E.; Hoefnagels, R.; Dieltiens, P. E. M.; Dermaut, W.; Geise, H.; Jin, Yadong; Heremans, Paul (2001)

Extraction of bulk and contact components of the series resistance in organic bulk-donor-acceptor-heterojunction cells

Aernouts, Tom; Geens, Wim; Poortmans, Jef; Heremans, Paul; Borghs, Gustaaf (2001)

Mesoscopic quantum circuits : A balance equation approach

Soree, Bart; Magnus, Wim; Schoenmaker, Wim (2000)

Progress towards quantitative high spatial resolution 1D and 2D carrier profiling using scanning probe techniques

Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo; Vandervorst, Wilfried (2000)

High temperature grazing incidence XRD study on in-situ crystallization in ultra-thin oxide films

Zhao, Chao; Roebben, G.; Young, Edward; Bender, Hugo; Houssa, Michel; Naili, Mohamed; De Gendt, Stefan (2000)

Irradiation effects of silicon dioxide films implanted by carbon ions

Yu, Y. H.; Zhao, J.; Jin, S. (2000)

Fast and accurate analysis of the multiconductor interconnects

Ymeri, Hasan; Nauwelaers, Bart (2000)

Dynamic scheduling of concurrent tasks with cost performance trade-off

Yang, Peng; Desmet, Dirk; Catthoor, Francky; Verkest, Diederik (2000)

Electrical evaluation and TEM/SEm investigation of a bottomless I-PVD Ta(N) barrier in a damascene architecture

Yamagishi, Hajime; Tokei, Zsolt; Beyer, Gerald; Donaton, R. A.; Bender, Hugo; Nogami, T.; Maex, Karen (2000)

Metrology method for the correlation of line edge roughness for different resists before and after etch

Winkelmeier, Stephanie; Sarstedt, Margit; Ercken, Monique; Goethals, Mieke; Ronse, Kurt (2000)

Removal of particles during dHF-based cleaning recipes

Vos, Rita; Cornelissen, Ingrid; Xu, Kaidong; Lux, Marcel; Fyen, Wim; Meuris, Marc; Mertens, Paul; Heyns, Marc (2000)

Experimental validation of finite element modeling

Vogel, D.; Jian, C.; De Wolf, Ingrid (2000)

Applying dipole illumination to characterize the imaging performance of 193nm photoresists for the 100nm node

Vleeming, Bert; Heskamp, B.; Finders, Jo; Jaenen, Patrick (2000)

Management of a QoS enabled WDM access feeder network

Vermeulen, Brecht; Vanhastel, Stefaan; Scholaert, Frederik; Dhoedt, Bart; Demeester, Piet (2000)

Calibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology

Vermandel, Miguel; Doutreloigne, Jan; Moens, P.; Tack, Marnix (2000)

Investigation of fluorine in dry ultrathin silicon oxides

Vereecke, Guy; Röhr, Erika; Carter, Richard; Conard, Thierry; De Witte, Hilde; Heyns, Marc (2000)

Presentations: Recent submissions

MEMS and submicron CMOS ﻿

High-level simulation of substrate noise generation in complex digital systems ﻿

Transistor optimisation for a low-cost, high-performance 0.13 μm CMOS technology ﻿

Band alignment at the interfaces of Al2O3 and ZrO2-based insulators with metals and Si ﻿

Optimal guest-host energy transfer from poly N-vinylcarbazole to blue-emitting para-phenylene-vynilene trimers ﻿

Extraction of bulk and contact components of the series resistance in organic bulk-donor-acceptor-heterojunction cells ﻿

Mesoscopic quantum circuits : A balance equation approach ﻿

Progress towards quantitative high spatial resolution 1D and 2D carrier profiling using scanning probe techniques ﻿

High temperature grazing incidence XRD study on in-situ crystallization in ultra-thin oxide films ﻿

Irradiation effects of silicon dioxide films implanted by carbon ions ﻿

Fast and accurate analysis of the multiconductor interconnects ﻿

Dynamic scheduling of concurrent tasks with cost performance trade-off ﻿

Electrical evaluation and TEM/SEm investigation of a bottomless I-PVD Ta(N) barrier in a damascene architecture ﻿

Metrology method for the correlation of line edge roughness for different resists before and after etch ﻿

Removal of particles during dHF-based cleaning recipes ﻿

Experimental validation of finite element modeling ﻿

Applying dipole illumination to characterize the imaging performance of 193nm photoresists for the 100nm node ﻿

Management of a QoS enabled WDM access feeder network ﻿

Calibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology ﻿

Investigation of fluorine in dry ultrathin silicon oxides ﻿