Recently added

A new compact eucentric goniometer for RBS, HFS, PIXE, and channeling

Strathman, M.; Brijs, Bert (1998)

Scanning probe microscopy of 1-D and 2-D carrier distributions

Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Vandervorst, Wilfried (1998)

Local mechanical stress induced during Ti- and Co/Ti silicidation reaction in sub-0.25 µm MOS technologies

Steegen, An; De Wolf, Ingrid; Bender, Hugo; Maex, Karen (1998)

Theory of new interpolation method based on random sampling

Schoenmaker, Wim; Cartuyvels, Rudi; Govoreanu, Bogdan (1998)

Light propagation through microscopically textured surfaces

Schoberth, Stefan; Windisch, Reiner; Dutta, Barundeb; Heremans, Paul; Meinlschmidt, S.; Kiesel, P.; Borghs, Gustaaf; Dohler, G. H. (1998)

High quality, relaxed Si1-xGex epitaxial layers for solar cell application

Said, Khalid; Poortmans, Jef; Caymax, Matty; Loo, Roger; Daami, A.; Bremond, G.; Kruger, O.; Kittler, M. (1998)

Role of UV/chlorine exposure during dry surface conditioning before integrated epi deposition process

Ruzyllo, Jerzy; Röhr, Erika; Baeyens, Martien; Conard, Thierry; Mertens, Paul; Heyns, Marc (1998)

Gas-phase surface proessing prior to 3.2nm gate oxidation

Ruzyllo, Jerzy; Röhr, Erika; Baeyens, Martien; Bearda, Twan; Mertens, Paul; Heyns, Marc (1998)

Gettering and stimulating factors on the formation of SIMOX structures with thin dielectric layer: experiment and modelling

Romanyuk, B. N.; Litovchenko, V. G.; Efremov, A. A.; Mel'nik, V. P.; Claeys, C. (1998)

Lithography simulation with aerial image-variable threshold resist model

Randall, John; Gangala, Hareen K; Tritchkov, Alexander (1998)

Distribution of fields and charge carriers in cylindrical and planar nanosize structures

Pokatilov, E. P.; Balaban, S. N.; Klimin, S. N.; Fomin, V. M.; Devreese, J. T.; Magnus, Wim; Van Rossum, Marc; De Meyer, Kristin; Schoenmaker, Wim (1998)

Plasma immersion ion implantation for shallow junctions in silicon

Pinter, Istvan; Abdulhadi, A.; Makaro, Z.; Khanh, N.; Adam, M.; Barsony, I.; Sivoththaman, Sivanarayanamoorthy; Poortmans, Jef; Song, H.; Adriaenssens, G. (1998)

Computation complexity profiling of the IM-1 MPEG-4 player

Peon, Mercedes; Nachtergaele, Lode; Lafruit, Gauthier; Vos, Peter; Bormans, Jan (1998)

A new physically-based model for temperature acceleration of time-to-breakdown

Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998)

Radiation damage in InGaP/InGaAs P-HEMTs by 20MeV alpha rays

Ohyama, Hidenori; Hakata, T.; Juroda, S.; Simoen, Eddy; Claeys, C.; Takami, Y.; Sunaga, H. (1998)

Two examples of CMOS active pixel sensor systems for space use

Ogiers, Werner; Uwaerts, Dirk; Scheffer, Danny; Dierickx, Bart (1998)

Sol-gel growth of high quality Pb (Zr.30, Ti.70) films onf RuO 2 using seedlayers

Norga, Gerd; Wouters, Dirk; Fè, Laura; Bartic, T. A.; Maes, Herman (1998)

Control of texture and crystallization in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 electrode layers

Norga, Gerd; Wouters, D. J.; Fè, Laura; Bartic, Andrei; Maes, Herman (1998)

An inelastic quantum tunnelling model for current conduction after soft-breakdown

Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998)

Influence of Boron diffusion on reliability of ultra-thin oxides

Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman (1998)

Presentations: Recent submissions

A new compact eucentric goniometer for RBS, HFS, PIXE, and channeling ﻿

Scanning probe microscopy of 1-D and 2-D carrier distributions ﻿

Local mechanical stress induced during Ti- and Co/Ti silicidation reaction in sub-0.25 µm MOS technologies ﻿

Theory of new interpolation method based on random sampling ﻿

Light propagation through microscopically textured surfaces ﻿

High quality, relaxed Si1-xGex epitaxial layers for solar cell application ﻿

Role of UV/chlorine exposure during dry surface conditioning before integrated epi deposition process ﻿

Gas-phase surface proessing prior to 3.2nm gate oxidation ﻿

Gettering and stimulating factors on the formation of SIMOX structures with thin dielectric layer: experiment and modelling ﻿

Lithography simulation with aerial image-variable threshold resist model ﻿

Distribution of fields and charge carriers in cylindrical and planar nanosize structures ﻿

Plasma immersion ion implantation for shallow junctions in silicon ﻿

Computation complexity profiling of the IM-1 MPEG-4 player ﻿

A new physically-based model for temperature acceleration of time-to-breakdown ﻿

Radiation damage in InGaP/InGaAs P-HEMTs by 20MeV alpha rays ﻿

Two examples of CMOS active pixel sensor systems for space use ﻿

Sol-gel growth of high quality Pb (Zr.30, Ti.70) films onf RuO 2 using seedlayers ﻿

Control of texture and crystallization in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 electrode layers ﻿

An inelastic quantum tunnelling model for current conduction after soft-breakdown ﻿

Influence of Boron diffusion on reliability of ultra-thin oxides ﻿