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Recent submissions
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Presentations
Recent submissions
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Presentations: Recent submissions
Now showing items 4221-4240 of 4592
Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, C.
(
1998
)
Half-wavelength microcavity with two metal mirrors for organic light emitting diodes
Neyts, K.
;
Fork, D.
;
Weber, E. R.
;
De Visschere, Patrick
(
1998
)
MBE growth and characterization of strained InAlAs/inAs/InAsSb/InAs superlattices for mid-IR type II lasers
Nemeth, Stefan
;
Van Hoof, Chris
;
Behet, Markus
;
Bender, Hugo
;
Borghs, Gustaaf
;
Fuchs, F.
;
Wagner, J.
(
1998
)
Wavelet coefficient bitranges
Nachtergaele, Lode
;
Vanhoof, Bart
;
Lafruit, Gauthier
;
Bormans, Jan
(
1998
)
Implementation results of wavelet transform on various platforms
Nachtergaele, Lode
;
Van Loenen, Arno Kasper
;
Braspenning, Ralph
;
Lafruit, Gauthier
;
Bormans, Jan
(
1998
)
Software optimizations of the lossless integer wavelet transform
Nachtergaele, Lode
;
Van Loenen, Arno Kasper
;
Braspenning, Ralph
;
Lafruit, Gauthier
;
Bormans, Jan
(
1998
)
The formation of Pd seeded copper layer on TiN substrates by electroless deposition
Min, Woo Sig
;
Lantasov, Yuri
;
Palmans, Roger
;
Maex, Karen
;
Lee, D. N.
(
1998
)
The integration of low k hydrogen silsesquioxanes (HSQ) in sub 0.35µm processes
Meynan, H.
;
Uttech, R.
;
Gao, Teng
;
Van Hove, Marleen
;
Maex, Karen
(
1998
)
Evaluation of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, Raman spectroscopy and electrical data
McNally, P. J.
;
Curley, J. W.
;
Bolt, M.
;
Reader, A.
;
De Wolf, Ingrid
;
Tuomi, T.
;
Rantamäki, R.
;
Danilewski, A. N.
(
1998
)
Reliability of ultra-thin dielectrics for giga scale silicon technologies
Maes, Herman
;
Degraeve, Robin
;
Nigam, Tanya
;
De Blauwe, Jan
;
Groeseneken, Guido
(
1998
)
The rinsing problem: effect of solute-surface interactions on wafer purity
Loewenstein, Lee
;
Mertens, Paul
(
1998
)
Evaluation of post metal etch cleaning by analyzing chemical compositions and distributions
Li, H.
;
Baklanov, Mikhaïl
;
Boullart, Werner
;
Conard, Thierry
;
Brijs, Bert
;
Maex, Karen
;
Froyen, L.
(
1998
)
Characterization and barrier properties for Cu metallization of tungsten nitride deposited by PECVD using WF6+N2+H2
Li, H.
;
Heyvaert, Ilse
;
Jin, S.
;
Lanckmans, Filip
;
Bender, Hugo
;
Maex, Karen
;
Froyen, L.
(
1998
)
Plasma process induced physical damage on ultra thin gate oxide
Lee, Hean-Cheal
;
Vanhaelemeersch, Serge
(
1998
)
Nanoscaled impedimetric sensor for DNA- & immunosensing
Laureyn, Wim
;
Van Gerwen, Peter
;
Jacobs, Philippe
;
Huyberechts, Guido
;
Baert, Kris
;
Rossau, R.
;
Maes, Guido
;
Mertens, Robert
;
Van de Voorde, A.
(
1998
)
Nanoscaled impedimetric sensor for DNA- & immunosensing
Laureyn, Wim
;
Van Gerwen, Peter
;
Jacobs, Philippe
;
Huyberechts, Guido
;
Baert, Kris
;
Rossau, R.
;
Maes, Guido
;
Mertens, Robert
;
Van de Voorde, A.
(
1998
)
Nanoscaled impedimetric sensor for DNA- & immunosensing
Laureyn, Wim
;
Van Gerwen, Peter
;
Jacobs, Philippe
;
Huyberechts, Guido
;
Baert, Kris
;
Rossau, R.
;
Maes, Guido
;
Mertens, Robert
;
Van de Voorde, A.
(
1998
)
Nanoscaled impedimetric sensor for DNA- & immunosensing
Laureyn, Wim
;
Van Gerwen, Peter
;
Jacobs, Philippe
;
Huyberechts, Guido
;
Baert, Kris
;
Rossau, R.
;
Maes, Guido
;
Mertens, Robert
;
Van de Voorde, A.
(
1998
)
Post dry-etch cleaning issues of an organic low-K dielectric
Lanckmans, Filip
;
Baklanov, Mikhaïl
;
Alaerts, Carine
;
Vanhaelemeersch, Serge
;
Maex, Karen
(
1998
)
Complexity analysis of facial animation software for CGD
Lafruit, Gauthier
;
Pockaj, R.
;
Bormans, Jan
(
1998
)
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