Recently added

Optimising the solder joint reliability of polymer stud grid array (PSGATM) packages using thermo-mechanical analysis

Vandevelde, Bart; Christiaens, Filip; Beyne, Eric; Van Puymbroeck, Jan; Heerman, M. (1997)

Understanding mixing mechanisms by quantitative internal profiling

Vandervorst, Wilfried; Wu, Ting-Di; Gomez, Jose Ignacio; D'Olieslaeger, Marc (1997)

ULSI-device characterization using conductive scanning probes

Vandervorst, Wilfried; Trenkler, Thomas; De Wolf, Peter; Clarysse, Trudo; Hellemans, L. (1997)

Artifacts in SIMS depth profiling

Vandervorst, Wilfried; De Witte, Hilde; Tian, Chunsheng; Geenen, Luc (1997)

Wavelength requirements in WDM networks

Van Parys, Wim; Wauters, Nico; Demeester, Piet; Van Caenegem, Bart; Lagasse, Paul (1997)

Near-field optical spectroscopy of resonant tunneling light-emitters

Van Hoof, Chris; Stuer, Cindy; Goovaerts, E.; Borghs, Gustaaf (1997)

Gigahertz microcavity light-emitters using resonant tunneling devices

Van Hoof, Chris; De Neve, Hans; Borghs, Gustaaf (1997)

Near-field optical microscopy of tunneling-based light-emitters

Van Hoof, Chris (1997)

Nanoscaled impedimetric sensors for multiparameter testing of biochemical samples

Van Gerwen, Peter; Varlan, A.; Huyberechts, Guido; Op de Beeck, Maaike; Baert, Kris; Sansen, Willy; Hermans, Lou; Mertens, Robert (1997)

InP-based heterostructures for low-noise and power applications

van der Zanden, Koen; Behet, Markus; De Raedt, Walter; van Meer, Hans; Schreurs, Dominique; Borghs, Gustaaf (1997)

Approximation of state functions in measurement-based transistor models

Van Den Bosch, Sven; Martens, Luc (1997)

SPICE modelling of saturation-protected BJT's with second collector feedback using IC-CAP macro-modelling

Van Den Bosch, Sven; Demey, M.; Ysebaert, J.; Witters, Johan; Martens, Luc (1997)

Restoration and spare capacity assignment in WDM networks

Van Caenegem, Bart; De Turck, Filip; Demeester, Piet (1997)

Formation mechanism of chemically etched porous silicon

Stalmans, Lieven; Vazsonyi, Eva; Bender, Hugo; Szilagyi, E.; Jalsovsky, G.; Horvath, Z. E.; Petrik, P.; Poortmans, Jef; Nijs, Johan (1997)

Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

Simoen, Eddy; Claeys, C.; Ohyama, Hidenori; Takami, Y.; Sunaga, H. (1997)

On the accuracy of digital measurements of random processes

Sikula, J.; Sikulova, M.; Hashigushi, S.; Claeys, Cor (1997)

Hot hole induced degradation of oxynitrides

Sii, H. K.; Zhang, Jenny; Groeseneken, Guido (1997)

Time dependence of quantum-well recombination luminescence in a bipolar AlAs/GaAs resonant tunneling structure

Romandic, Igor; Bouwen, A.; Goovaerts, E.; Van Hoof, Chris; Mielants, Mieke; Borghs, Gustaaf (1997)

Measurement of nonuniform stresses in semiconductor films by optical methods

Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1997)

Radiation damage in Si1-xGex heteroepitaxial devices

Ohyama, Hidenori; Hayama, Kiyoteru; Simoen, Eddy; Claeys, Cor; Poortmans, Jef; Caymax, Matty; Vanhellemont, Jan; Takami, Y.; Sunaga, H. (1997)

Presentations: Recent submissions

Optimising the solder joint reliability of polymer stud grid array (PSGATM) packages using thermo-mechanical analysis ﻿

Understanding mixing mechanisms by quantitative internal profiling ﻿

ULSI-device characterization using conductive scanning probes ﻿

Artifacts in SIMS depth profiling ﻿

Wavelength requirements in WDM networks ﻿

Near-field optical spectroscopy of resonant tunneling light-emitters ﻿

Gigahertz microcavity light-emitters using resonant tunneling devices ﻿

Near-field optical microscopy of tunneling-based light-emitters ﻿

Nanoscaled impedimetric sensors for multiparameter testing of biochemical samples ﻿

InP-based heterostructures for low-noise and power applications ﻿

Approximation of state functions in measurement-based transistor models ﻿

SPICE modelling of saturation-protected BJT's with second collector feedback using IC-CAP macro-modelling ﻿

Restoration and spare capacity assignment in WDM networks ﻿

Formation mechanism of chemically etched porous silicon ﻿

Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes ﻿

On the accuracy of digital measurements of random processes ﻿

Hot hole induced degradation of oxynitrides ﻿

Time dependence of quantum-well recombination luminescence in a bipolar AlAs/GaAs resonant tunneling structure ﻿

Measurement of nonuniform stresses in semiconductor films by optical methods ﻿

Radiation damage in Si1-xGex heteroepitaxial devices ﻿