Recently added

Regular expressions and modeling of life cycles

Hoffman, Johan (1997)

A practical notation for object oriented analysis with a formal meaning

Hoffman, Johan (1997)

Degradation of MOSFETs on SIMOX by irradiation

Hakata, T.; Ohyama, Hidenori; Simoen, Eddy; Claeys, C.; Vanhellemont, Jan; Takami, Y.; Sunaga, H.; Ogita, Y. (1997)

Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters

Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert; Maes, Herman; Gornik, E. (1997)

Analysis of charge pumping characteristics of single interface traps

Habas, Predrag; De Wolf, Ingrid; Groeseneken, Guido; Stesmans, Andre; Maes, Herman (1997)

Optimized microelens shape by reflow of multiple layers of photoresist: experimental data and lens shape calculations

Genoe, Jan; Heremans, Paul; Kuijk, Maarten; Vounckx, Roger; Borghs, Gustaaf (1997)

Design aspects of an OFDM based wireless LAN with regard to ASIC integration

Eberle, Wolfgang; Van der Perre, Liesbet; Gyselinckx, Bert; Engels, Marc; Bolsens, Ivo (1997)

Industrial process for bulk and surface passivation of multicrystalline silicon solar cells

Duerinckx, Filip; Einhaus, Roland; Van Kerschaver, Emmanuel; Szlufcik, Jozef; Nijs, Johan; Mertens, Robert; Roy, M.; Narayanan, S. (1997)

Méthodologie globale de minimisation de la consommation et du volume de stockage dans les applications dominées par les accès aux données

Diguet, Jean-Philippe; Catthoor, Francky; Eyckmans, Michel; Balasa, Florin; Danckaert, Koen; De Greef, Eddy; Miranda, Miguel; Slock, Peter; Wuytack, Sven (1997)

Sub 3 nm gate oxide growth and reliability

Depas, Michel; Heyns, Marc; Sprey, Hessel; Wilhelm, Rudi (1997)

Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS

Deleu, Jeroen; Brijs, Bert; Vandervorst, Wilfried (1997)

Application of Raman spectroscopy to semiconductor layers

De Wolf, Ingrid (1997)

Modeling of bombardment induced oxidation of silicon with and without oxygen flooding

De Witte, Hilde; Vandervorst, Wilfried; Gijbels, Renaat (1997)

Education for the deep submicron age: business as usual

De Man, Hugo (1997)

Impact of iron contamination and SC1 generated roughness on 5nm gate oxides

De Gendt, Stefan; Knotter, D. M.; Kenis, Karine; Mertens, Paul; Heyns, Marc (1997)

Reliable 5.9nm tunnel oxide flash EEPROM device

De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997)

Thermal modelling of the polymer stud grid array (PSGATM) steady-state analysis

Christiaens, Filip; Vandevelde, Bart; Beyne, Eric; Roggen, Jean; Mertens, Robert; Van Puymbroeck, Jef; Heerman, M.; Berghmans, Jan (1997)

Compact transient thermal models for the polymer stud grid array (PSGATM) package

Christiaens, Filip; Beyne, Eric; Vandevelde, Bart; Roggen, Jean; Mertens, Robert; Van Puymbroeck, Jef; Heerman, M.; Berghmans, J. (1997)

Elastic recoil detection of hydrogen in combination with low energy argon sputtering

Brijs, Bert; Deleu, Jeroen; Van Beeck, W.; Vandervorst, Wilfried (1997)

Initial assessment of the still-image scalability implementation complexity

Bormans, Jan; Lafruit, Gauthier (1997)

Presentations: Recent submissions

Regular expressions and modeling of life cycles ﻿

A practical notation for object oriented analysis with a formal meaning ﻿

Degradation of MOSFETs on SIMOX by irradiation ﻿

Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters ﻿

Analysis of charge pumping characteristics of single interface traps ﻿

Optimized microelens shape by reflow of multiple layers of photoresist: experimental data and lens shape calculations ﻿

Design aspects of an OFDM based wireless LAN with regard to ASIC integration ﻿

Industrial process for bulk and surface passivation of multicrystalline silicon solar cells ﻿

Méthodologie globale de minimisation de la consommation et du volume de stockage dans les applications dominées par les accès aux données ﻿

Sub 3 nm gate oxide growth and reliability ﻿

Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS ﻿

Application of Raman spectroscopy to semiconductor layers ﻿

Modeling of bombardment induced oxidation of silicon with and without oxygen flooding ﻿

Education for the deep submicron age: business as usual ﻿

Impact of iron contamination and SC1 generated roughness on 5nm gate oxides ﻿

Reliable 5.9nm tunnel oxide flash EEPROM device ﻿

Thermal modelling of the polymer stud grid array (PSGATM) steady-state analysis ﻿

Compact transient thermal models for the polymer stud grid array (PSGATM) package ﻿

Elastic recoil detection of hydrogen in combination with low energy argon sputtering ﻿

Initial assessment of the still-image scalability implementation complexity ﻿