Recently added

Defect passivation by means of PECVD-nitride and hydrogenation for crystalline Si solar cells

Poortmans, Jef; Szlufcik, Jozef; Duerinckx, Filip; De Clercq, Koen; Horzel, Jörg; Vermeulen, Tom; Evrard, Olivier; Nijs, Johan; Mertens, Robert (1996)

A study of MBE growth modes using RE model

Papajová, D.; Nemeth, Stefan; Vesely, M.; Sitter, H. (1996)

DUV resist materials and processes for 0.25 μm and 0.18 μm CMOS devices

Op de Beeck, Maaike; Vandenberghe, Geert; Goethals, Mieke; Van den hove, Luc (1996)

Integral equation techniques: towards larger and more complicated structures

Olyslager, Frank (1996)

Closed form Green's Dyadics for different homogeneous bianisotropic media

Olyslager, Frank (1996)

Degradation and recovery of Si1-xGex devices after proton irradiation

Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996)

New technologies for multicrystalline silicon cells

Nijs, Johan; Sivoththaman, Sivanarayanamoorthy; Poortmans, Jef; Mertens, Robert (1996)

Growth and reliability of 3nm N2O gate oxide

Nigam, Tanya; Depas, Michel; Heyns, Marc (1996)

Growth and characterization of bulk AlAsSb and InAsSb on GaAs and InAs substrates

Nemeth, Stefan; Grietens, Bob; Borghs, Gustaaf (1996)

Harmonic distortion in semiconductor lasers for analog transmission

Morthier, Geert (1996)

The evaluation and the inegration of low-k organic spin-on materials in a non-etchback interconnect process

Meynen, Herman; Waeterloos, Joost; Coenegrachts, Bart; Gao, Teng; Grillaert, Joost; Van den hove, Luc (1996)

Error analysis for electromagnetic modelling in bioelectromagnetics

Martens, Luc; Dhondt, Geert (1996)

Error analysis of numerical and experimental dosimetry related to mobile communications

Martens, Luc (1996)

Enhancement of planar loop inductance using a magnetic layer

Mahmoud, Samir Fahmi; Beyne, Eric (1996)

Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions

Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1996)

Optical chip interconnections: economically viable?

Kuijk, Maarten; Ayadi, Kamel; Vounckx, Roger; Borghs, Gustaaf; Bickel, Gerhard; Heremans, Paul (1996)

Grown-in defect density spectra in czochralski silicon wafers

Kissinger, G.; Gräf, D.; Lambert, U.; Vanhellemont, Jan; Richter, H. (1996)

Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantation

Jin, S.; Bender, Hugo; Li, Xiuqiong; Dong, C.; Zhang, Zheng (1996)

Transmission electron microscopic study of new Fe-disilicide phase prepared by ion implantation

Jin, S.; Bender, Hugo (1996)

Effect of strain on mid-IR and LWIR lasers and detectors

Jain, Suresh; Van Hoof, Chris; Grietens, Bob; Nemeth, Stefan; Merken, Patrick; Borghs, Gustaaf (1996)

Presentations: Recent submissions

Defect passivation by means of PECVD-nitride and hydrogenation for crystalline Si solar cells ﻿

A study of MBE growth modes using RE model ﻿

DUV resist materials and processes for 0.25 μm and 0.18 μm CMOS devices ﻿

Integral equation techniques: towards larger and more complicated structures ﻿

Closed form Green's Dyadics for different homogeneous bianisotropic media ﻿

Degradation and recovery of Si1-xGex devices after proton irradiation ﻿

New technologies for multicrystalline silicon cells ﻿

Growth and reliability of 3nm N2O gate oxide ﻿

Growth and characterization of bulk AlAsSb and InAsSb on GaAs and InAs substrates ﻿

Harmonic distortion in semiconductor lasers for analog transmission ﻿

The evaluation and the inegration of low-k organic spin-on materials in a non-etchback interconnect process ﻿

Error analysis for electromagnetic modelling in bioelectromagnetics ﻿

Error analysis of numerical and experimental dosimetry related to mobile communications ﻿

Enhancement of planar loop inductance using a magnetic layer ﻿

Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions ﻿

Optical chip interconnections: economically viable? ﻿

Grown-in defect density spectra in czochralski silicon wafers ﻿

Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantation ﻿

Transmission electron microscopic study of new Fe-disilicide phase prepared by ion implantation ﻿

Effect of strain on mid-IR and LWIR lasers and detectors ﻿