Recently added

Stresses in LOCOS, stripes and quantum device heterostructures

Jain, Suresh; Maes, Herman; Willander, M. (1996)

Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-raman and other measurements

Jain, Suresh; Maes, Herman (1996)

Pollution prevention: the process contribution

Heyns, Marc (1996)

Optoelectronic devices and switches for short-distance optical interconnects

Heremans, Paul; Kuijk, Maarten; Bickel, Gerhard; Ayadi, Kamel; Vounckx, Roger; Borghs, Gustaaf (1996)

Electromagnetic measurements in a multi-frequency environment

Haelvoet, Kurt; Dobbelaere, Franky; Martens, Luc (1996)

New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides

Groeseneken, Guido; Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Depas, Michel; Maes, Herman (1996)

Growth and characterization of mid-infrared InAsSb/InAs strained multiple quantum well light-emitting diodes grown on InAs substrates

Grietens, Bob; Nemeth, Stefan; Borghs, Gustaaf (1996)

Comparison of Co silicidation on SiGe and SiGeC alloys

Donaton, R. A.; Maex, Karen; Vantomme, Andre; St. Amour, A.; Sturm, J. C. (1996)

Smart camera's and special sensors

Dierickx, Bart (1996)

Influence of bufferlayer and processing on the dark current of 2.5µm wavelength, 2% mismatched InGaAs photodetectors

D'Hondt, Mark; Moerman, Ingrid; Van Daele, P.; Demeester, Piet (1996)

Characterisation of 2% mismatched InGaAs layers, grown on different bufferlayers and at different growth temperatures

D'Hondt, Mark; Moerman, Ingrid; Demeester, Piet (1996)

GIRO gratings: a novel concept for mirrors with high reflectivity and polarisation selectivity

Dhoedt, Bart; Goeman, Stefan; DeMeulenaere, Bart; Baekelandt, Bart; De Zutter, Daniel; Baets, Roel (1996)

Prediction and measurement of radiation, shielding and crosstalk for application in high-speed telecommunications and systems

De Zutter, Daniel (1996)

Quantitative carrier profiling of silicon devices by nano-srp

De Wolf, Peter; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaerts, Jan; Hellemans, L. (1996)

Reducing storage size for static control programs mapped onto parallel structures

De Greef, Eddy; Catthoor, Francky; De Man, Hugo (1996)

Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)

De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996)

Parametrizable architecture for the motion estimator chip

Cmar, Radim; Vernalde, Serge (1996)

A systematic HW/SW co-design approach

Bolsens, Ivo (1996)

A systematic approach for HW/SW co-design of systems on silicon

Bolsens, Ivo (1996)

Bridging the gap between system level specification and HW/SW implementation

Bolsens, Ivo (1996)

Presentations: Recent submissions

Stresses in LOCOS, stripes and quantum device heterostructures ﻿

Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-raman and other measurements ﻿

Pollution prevention: the process contribution ﻿

Optoelectronic devices and switches for short-distance optical interconnects ﻿

Electromagnetic measurements in a multi-frequency environment ﻿

New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides ﻿

Growth and characterization of mid-infrared InAsSb/InAs strained multiple quantum well light-emitting diodes grown on InAs substrates ﻿

Comparison of Co silicidation on SiGe and SiGeC alloys ﻿

Smart camera's and special sensors ﻿

Influence of bufferlayer and processing on the dark current of 2.5µm wavelength, 2% mismatched InGaAs photodetectors ﻿

Characterisation of 2% mismatched InGaAs layers, grown on different bufferlayers and at different growth temperatures ﻿

GIRO gratings: a novel concept for mirrors with high reflectivity and polarisation selectivity ﻿

Prediction and measurement of radiation, shielding and crosstalk for application in high-speed telecommunications and systems ﻿

Quantitative carrier profiling of silicon devices by nano-srp ﻿

Reducing storage size for static control programs mapped onto parallel structures ﻿

Degradation and nitridation dependence of steady-state stress induced leakage current (SILC) ﻿

Parametrizable architecture for the motion estimator chip ﻿

A systematic HW/SW co-design approach ﻿

A systematic approach for HW/SW co-design of systems on silicon ﻿

Bridging the gap between system level specification and HW/SW implementation ﻿

Stresses in LOCOS, stripes and quantum device heterostructures

Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-raman and other measurements

Pollution prevention: the process contribution

Optoelectronic devices and switches for short-distance optical interconnects

Electromagnetic measurements in a multi-frequency environment

New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides

Growth and characterization of mid-infrared InAsSb/InAs strained multiple quantum well light-emitting diodes grown on InAs substrates

Comparison of Co silicidation on SiGe and SiGeC alloys

Smart camera's and special sensors

Influence of bufferlayer and processing on the dark current of 2.5µm wavelength, 2% mismatched InGaAs photodetectors

Characterisation of 2% mismatched InGaAs layers, grown on different bufferlayers and at different growth temperatures

GIRO gratings: a novel concept for mirrors with high reflectivity and polarisation selectivity

Prediction and measurement of radiation, shielding and crosstalk for application in high-speed telecommunications and systems

Quantitative carrier profiling of silicon devices by nano-srp

Reducing storage size for static control programs mapped onto parallel structures

Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)

Parametrizable architecture for the motion estimator chip

A systematic HW/SW co-design approach

A systematic approach for HW/SW co-design of systems on silicon

Bridging the gap between system level specification and HW/SW implementation