Recently added

Analysis and improvements of power consumption in digital modem architecturer

Bolsens, Ivo (1996)

The polymer stud grid array package

Beyne, Eric; Vandevelde, Bart; Christiaens, Filip; Roggen, Jean; Van Puymbroeck, J.; Boone, L.; Heerman, M. (1996)

Tutorial : Multi chip modules

Beyne, Eric (1996)

Opportunities in thin film MCM

Beyne, Eric (1996)

Epitaxial GdSi1.7 prepared by ion beam synthesis on (111) silicon

Bender, Hugo; Jin, S.; Wu, Ming Fang; Vantomme, Andre; Pattyn, Hugo; Langouche, H. (1996)

Characterization and process integration of a low-k spin-on dielectric

Ballantyne, Catherine; Forester, Lynn; Waeterloos, Joost (1996)

Protective films formed during the etching of TiSi2 and CoSi2 in F-based plasmas

Baklanov, Mikhaïl; Vanhaelemeersch, Serge; Storm, Wolfgang; Vandervorst, Wilfried; Maex, Karen (1996)

Laser diode, modelling and parameter extraction. Experience from the COST240 project

Baets, Roel (1996)

Stability of epitaxially strained semiconductor stripes

Atkinson, A.; Jain, Suresh; Pinardi, Kuntjoro (1996)

Strain measurements in thin film structures by convergent beam electron diffraction

Armigliato, A.; Balboni, R.; Benedetti, A.; Frabboni, S.; Tixier, A.; Vanhellemont, Jan (1996)

An optical microsystem of predictive crash sensing

Ancona, N.; Creanza, G.; Fiore, D.; Tangorra, R.; Dierickx, Bart; Meynants, Guy; Hermans, Lou; Franz, J.; Weiler, H. G. (1996)

Step Function Photoconductive Signal Generation in Integrated Coplanar Text Fixtures

Zeng, A.; Jackson, M. K.; Van Hove, Marleen; De Raedt, Walter (1995)

Characterization of InAlAs/InGAAs MODFET Monolithically-Integrated With Coplanar Stripline Using Electro-Optic Sampling

Zeng, A.; Jackson, M. K.; Van Hove, Marleen; De Raedt, Walter (1995)

Orientation Effects on the Hysteresis Properties of Sol-Gel and Laser-Ablated Lead-Zirconate-Titanate (PbZrxTi1-xO3=PZT) Thin Films

Wouters, D. J.; Willems, Geert; Maes, Herman (1995)

Stress Migration in Submicron Metal Lines

Witvrouw, Ann (1995)

Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy

Watté, J.; Provoost, R.; Silverans, R. E.; De Wolf, Ingrid; Maes, Herman (1995)

Dry Development for 0.25 5m Top Surface Imaging

Vertommen, Johan; Goethals, Mieke (1995)

Effective Control of Non-Planar MOVPE Growth on Submicron Gratings for the Realization of Single Growth Run GaAs/AlGaAs Gain Coupled DFB Lasers

Vermeire, Gerrit; Vermaerke, Frank; Van Daele, P.; Demeester, Piet (1995)

A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs

Vasina, Petr; Sikula, J.; Simoen, Eddy; Claeys, C. (1995)

Carrier Profile Determination in Device Structures using AFM-Based Methods

Vandervorst, Wilfried; De Wolf, Peter; Clarysse, Trudo; Trenkler, Thomas; Hellemans, L.; Snauwaerts, Jan; Raineri, Vito (1995)

Presentations: Recent submissions

Analysis and improvements of power consumption in digital modem architecturer ﻿

The polymer stud grid array package ﻿

Tutorial : Multi chip modules ﻿

Opportunities in thin film MCM ﻿

Epitaxial GdSi1.7 prepared by ion beam synthesis on (111) silicon ﻿

Characterization and process integration of a low-k spin-on dielectric ﻿

Protective films formed during the etching of TiSi2 and CoSi2 in F-based plasmas ﻿

Laser diode, modelling and parameter extraction. Experience from the COST240 project ﻿

Stability of epitaxially strained semiconductor stripes ﻿

Strain measurements in thin film structures by convergent beam electron diffraction ﻿

An optical microsystem of predictive crash sensing ﻿

Step Function Photoconductive Signal Generation in Integrated Coplanar Text Fixtures ﻿

Characterization of InAlAs/InGAAs MODFET Monolithically-Integrated With Coplanar Stripline Using Electro-Optic Sampling ﻿

Orientation Effects on the Hysteresis Properties of Sol-Gel and Laser-Ablated Lead-Zirconate-Titanate (PbZrxTi1-xO3=PZT) Thin Films ﻿

Stress Migration in Submicron Metal Lines ﻿

Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy ﻿

Dry Development for 0.25 5m Top Surface Imaging ﻿

Effective Control of Non-Planar MOVPE Growth on Submicron Gratings for the Realization of Single Growth Run GaAs/AlGaAs Gain Coupled DFB Lasers ﻿

A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs ﻿

Carrier Profile Determination in Device Structures using AFM-Based Methods ﻿