Recently added

Verification of 2D SRP by the Analysis of Known Lateral Profiles

Vandervorst, Wilfried; Clarysse, Trudo; Caymax, Matty; Privitera, Vittorio (1995)

Wavelength Tuning by Quantum Well Electrorefraction in a Grating-Assisted Vertical Coupler Filter with InGaAsP/InAlGaAs MQW Waveguide

Van Der Bauwhede, Wim; Moerman, Ingrid; Van Daele, P.; Demeester, Piet (1995)

On the Regrowth of p-n-Current Blocking Layers for Waveguide Devices

Van Der Bauwhede, Wim; De Dobbelaere, Peter; Moerman, Ingrid; Van Daele, P.; Demeester, Piet (1995)

Reliability issues of flash memory

Van Houdt, Jan (1995)

Ferromagnetic Clusters in In1-xMnxAs and LT-GaAs:Mn

Van Esch, Ann; De Boeck, Jo; Oesterholt, René; François, Isabel; Bender, Hugo; Van Roy, Wim; Borghs, Gustaaf; Van Bockstal, L.; Bogaerts, R.; Herlach, F. (1995)

Hybrid Integrated Sensors

Van Calster, Andre (1995)

DC and Noise Behaviour of Short-Chanenl SOI MOSFETs

Valenza, M.; Barros, C.; Simoen, Eddy; Claeys, C.; van Dinther, Cees (1995)

Single Wavelength and Spectroscopic Ellipsometry Characterization of Ultra-Thin Gate Oxides on Silicon and Comparison with Electrical Results

Tonova, Diana; Depas, Michel; Libezny, Milan; Heyns, Marc; Vanhellemont, Jan (1995)

Recent Progress in a Low Cost Screen Printing Solar Cell Manufacturing Process

Szlufcik, Jozef; De Clercq, Koen; Frisson, Louis; Mertens, Robert (1995)

Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling

Snauwaerts, Jan; Blanc, N.; De Wolf, Peter; Hellemans, L. (1995)

Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors

Simoen, Eddy; Merron, B.; Decoutere, Stefaan (1995)

Models for Burst and RTS Noise Mechanism in Electronic Devices

Sikula, J.; Sikulova, M.; Vasina, Petr; Claeys, C.; Simoen, Eddy (1995)

Modellering van Niet-Lineaire HEMT MMIC's

Schreurs, Dominique (1995)

Charge Pumping at a Single Interface Trap

Saks, N. S.; Groeseneken, Guido; De Wolf, Ingrid (1995)

The Use of Complex Cubic Splines as a Powerful Mathematical Representation for (n,k) Reference Spectra in Spectroscopic Ellipsometry Applications

Roussel, Philippe; Libezny, Milan; Vanhellemont, Jan; Maes, Herman (1995)

Active Pixel CMOS Image Sensor with On-Chip Non-Uniformity Correction

Ricquier, Nico; Dierickx, Bart (1995)

a-SiN:H Thin Films for Application in Diode Array AMLCD's

Popov, I.; Tchernorotov, B. (1995)

Fabrication of Pseudomorphic AlGaAs/InGaAs HEMTs Using CH4/H2 RIE for Gate Recessing

Pereira, Ricardo; Van Hove, Marleen; Van Rossum, Marc (1995)

Stress Reduction in Tungsten CVD Films by RTA Post-Treatment of Ti/TiN Bilayers in Ammonia

Palmans, Roger; Mouroux, Aliette; Zhang, S. L.; Petersson, S.; Maex, Karen (1995)

Modèlisation d'un TEGFET à Deux Grilles pour la Réalisation d'un Amplificateur à Gain Variable en MMIC

Nauwelaers, Bart; Schreurs, Dominique; Baeyens, S.; Le Verger, Sophie; De Raedt, Walter (1995)

Presentations: Recent submissions

Verification of 2D SRP by the Analysis of Known Lateral Profiles ﻿

Wavelength Tuning by Quantum Well Electrorefraction in a Grating-Assisted Vertical Coupler Filter with InGaAsP/InAlGaAs MQW Waveguide ﻿

On the Regrowth of p-n-Current Blocking Layers for Waveguide Devices ﻿

Reliability issues of flash memory ﻿

Ferromagnetic Clusters in In1-xMnxAs and LT-GaAs:Mn ﻿

Hybrid Integrated Sensors ﻿

DC and Noise Behaviour of Short-Chanenl SOI MOSFETs ﻿

Single Wavelength and Spectroscopic Ellipsometry Characterization of Ultra-Thin Gate Oxides on Silicon and Comparison with Electrical Results ﻿

Recent Progress in a Low Cost Screen Printing Solar Cell Manufacturing Process ﻿

Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling ﻿

Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors ﻿

Models for Burst and RTS Noise Mechanism in Electronic Devices ﻿

Modellering van Niet-Lineaire HEMT MMIC's ﻿

Charge Pumping at a Single Interface Trap ﻿

The Use of Complex Cubic Splines as a Powerful Mathematical Representation for (n,k) Reference Spectra in Spectroscopic Ellipsometry Applications ﻿

Active Pixel CMOS Image Sensor with On-Chip Non-Uniformity Correction ﻿

a-SiN:H Thin Films for Application in Diode Array AMLCD's ﻿

Fabrication of Pseudomorphic AlGaAs/InGaAs HEMTs Using CH4/H2 RIE for Gate Recessing ﻿

Stress Reduction in Tungsten CVD Films by RTA Post-Treatment of Ti/TiN Bilayers in Ammonia ﻿

Modèlisation d'un TEGFET à Deux Grilles pour la Réalisation d'un Amplificateur à Gain Variable en MMIC ﻿