Recently added

Heyns, Marc; Meuris, Marc; Mertens, Paul; Hurd, Trace; Schmidt, Harald; Depas, Michel; Rotondaro, Antonio; Vermeire, Bert; Vandervorst, Wilfried; Storm, Wolfgang; Polleunis, C.; Bertrand, P.; McGeary, M. J.; Lubbers, A.; Hatcher, Z. (1995)

Cascadable Thyristor Optoelectronic Switch Operating at 50Mbit/Sec with 7.2 Femtojoule External Optical Input Energy

Heremans, Paul; Knüpfer, Bernhard; Kuijk, Maarten; Vounckx, Roger; Borghs, Gustaaf (1995)

Interband Magneto-Tunneling Through a Hole Well in InAs/AlSb/GaSb/AlSb/InAs Structures

Genoe, Jan; Maude, D.; Portal, J. C.; Nogaret, A.; Eaves, L.; Gauffier, J. L.; Van Hoof, Chris; Borghs, Gustaaf (1995)

Delay Times in Lattice Matched InGaAs/InP HEMT's with Gatelengths between 80 and 250 nm

Finders, Jo; Baeyens, Yves; Schreurs, Dominique; Van Hove, Marleen; De Raedt, Walter; Nauwelaers, Bart; Van Rossum, Marc (1995)

Depth Resolution and Ripple Formation on AlxGa 1-xAs

Elst, Kathy; Tian, Chunsheng; Vandervorst, Wilfried; Adams, F. (1995)

Dépendance des Caractéristiques Electriques, avec la Concentration Initiale d'Oxygène Interstitiel, de Diodes Si Irradiées avec des Electrons à Hautes Energies

Dubuc, Jean-Paul; Simoen, Eddy; Vanhellemont, Jan; Claeys, C. (1995)

Resonant Cavity LEDs

De Neve, Hans; Blondelle, Johan (1995)

Comparison of Different Buffer Layers for 1.9% Lattice-Mismatched InGaAs on InP for 2.5 mm Wavelength Photodetector Application

D'Hondt, Mark; Moerman, Ingrid; Demeester, Piet (1995)

1.8 Gbit/s GaAs MESFET Driver IC for Lightwave Modulators

Coppoolse, René; Vandewege, Jan (1995)

Burst Mode Bipolar Laser Driver for a Multipoint to Point Passive Optical Network at 155.52 Mbit/s

Coppoolse, René; Van Parys, Hans; Codenie, Jan; Vandewege, Jan (1995)

Presentations: Recent submissions

The Design of Laser Diodes with Low Distortion for Application in Large Bandwidth CATV-Systems ﻿

High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems ﻿

Champs Electromagnétiques ﻿

Canonical Cases for the Comparison of Simulation Tools for Near-Field EM Problems ﻿

Informatie- en Communicatietechnologie als Ondersteuning van Leeractiviteiten ﻿

Low-Frequency Noise in SOI p-MOSFETs Prepared on SIMOX and ZMR Substrates ﻿

Ellipsometric Determination of the Optical Properties of b-FeSi2 ﻿

Optical proximity correction: pattern generation issues ﻿

Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited ﻿

Artificial Neural Network Approach for Humidity Influenced Methane Sensor Responses Processing ﻿

Just-Clean- Enough technology for the 21st century ﻿

Cascadable Thyristor Optoelectronic Switch Operating at 50Mbit/Sec with 7.2 Femtojoule External Optical Input Energy ﻿

Interband Magneto-Tunneling Through a Hole Well in InAs/AlSb/GaSb/AlSb/InAs Structures ﻿

Delay Times in Lattice Matched InGaAs/InP HEMT's with Gatelengths between 80 and 250 nm ﻿

Depth Resolution and Ripple Formation on AlxGa 1-xAs ﻿

Dépendance des Caractéristiques Electriques, avec la Concentration Initiale d'Oxygène Interstitiel, de Diodes Si Irradiées avec des Electrons à Hautes Energies ﻿

Resonant Cavity LEDs ﻿

Comparison of Different Buffer Layers for 1.9% Lattice-Mismatched InGaAs on InP for 2.5 mm Wavelength Photodetector Application ﻿

1.8 Gbit/s GaAs MESFET Driver IC for Lightwave Modulators ﻿

Burst Mode Bipolar Laser Driver for a Multipoint to Point Passive Optical Network at 155.52 Mbit/s ﻿

The Design of Laser Diodes with Low Distortion for Application in Large Bandwidth CATV-Systems

High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems

Champs Electromagnétiques

Canonical Cases for the Comparison of Simulation Tools for Near-Field EM Problems

Informatie- en Communicatietechnologie als Ondersteuning van Leeractiviteiten

Low-Frequency Noise in SOI p-MOSFETs Prepared on SIMOX and ZMR Substrates

Ellipsometric Determination of the Optical Properties of b-FeSi2

Optical proximity correction: pattern generation issues

Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

Artificial Neural Network Approach for Humidity Influenced Methane Sensor Responses Processing

Just-Clean- Enough technology for the 21st century