Recently added

Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes

Claeys, C.; Dubuc, Jean-Paul; Simoen, Eddy (1995)

Weak Localisation and Scattering Mechanisms in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs Mesoscopic Wires

Carpi, Enio; Van Hove, Marleen; Van Rossum, Marc (1995)

Layer Thickness and Composition Control for the Fabrication of High Efficiency Microcavity LED's

Blondelle, Johan; De Neve, Hans; Demeester, Piet; Van Daele, P.; Baets, Roel; Borghs, Gustaaf (1995)

Magneto-Oscillations of the Gate Current in a Laterally Modulated Two-Dimensional Electron Gas

Blom, F. A. P.; Peeters, F. M.; van der Zanden, Koen; de Lange, W.; Van Hove, Marleen (1995)

Elements of the Leakage Current of High-Epsilon Ferroelectric PZT Films

Wouters, D. J.; Willems, Geert; Groeseneken, Guido; Maes, Herman; Brooks, K. (1994)

The Influence of Dopants on the Leakage Current in PZT Thin-Film Electroceramic Capacitors

Wouters, D.; Willems, Geert; Groeseneken, Guido; Maes, Herman; Brooks, K.; Klissurska, R. (1994)

Stress Relaxation in Al-Si-Cu Thin Films and Lines

Witvrouw, Ann; Proost, Joris; Deweerdt, Bruno; Roussel, Philippe; Maex, Karen (1994)

Synthesis of CoxFe1-xSi2 with High-Dose Ion Implantation and Reactive Codeposition Epitaxy

Vantomme, Andre; Wu, Ming Fang; Degroote, S.; Dekoster, J.; Langouche, G.; Tavares, J.; Bender, Hugo (1994)

Point defect reactions in silicon studied by in-situ high flux electron irradiation in a high voltage transmission electron microscope

Vanhellemont, Jan; Romano, Albert; Fedina, L.; Van Landuyt, J.; Aseev, A. (1994)

Spectroscopic study of oxygen related lattice defects in annealed silicon

Vanhellemont, Jan; Libezny, Milan; Simoen, Eddy; Claeys, Cor; Clauws, P.; Blondeel, A. (1994)

On the Determination of Two-Dimensional Carrier Distributions

Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994)

Lateral and Vertical Dopant Profiling in Semiconductors by Atomic Force Microscopy Using Conducting Tips

Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaerts, Jan (1994)

Secondary Ion Mass Spectrometry

Vandervorst, Wilfried (1994)

DUV Lithography for 0.35 µm CMOS Processing

Van Driessche, Veerle; Goethals, Mieke; Op de Beeck, Maaike; Ronse, Kurt; Van den hove, Luc (1994)

High Field Magnetotransport in a Ga0.8In0.2As Quantum Well with a Parallel Si d-Layer

van der Burgt, M.; Karavolas, V. C.; Peeters, F. M.; Singleton, J.; Nicholas, R. J.; Herlach, F.; Harris, J. J.; Van Hove, Marleen; Borghs, Gustaaf (1994)

Low Temperature Anneal of the Divacancy in p-Type Silicon

Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994)

Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon

Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994)

Optical Circuitry for Data Transcription and Digital Logic Based on Photothyristor Differential Pairs

Thienpont, H.; Van de Velde, T.; Kirk, A.; Peiffer, W.; Kuijk, Maarten; Stevens, W.; Fernandez, J.; Veretennicoff, I.; Vounckx, Roger; Heremans, Paul; Borghs, Gustaaf (1994)

Recent Progress in a Low Cost Screen Printing Solar Cell Manufacturing Process

Szlufcik, Jozef; De Clercq, Koen; Frisson, Louis; Nijs, Johan; Mertens, Robert (1994)

Ultrasmall waveguide bends: the corner mirrors of the future?

Spiekman, L. H.; Oei, Y. S.; Metaal, E. G.; Groen, F. H.; Demeester, Piet; Smit, M. K. (1994)

Presentations: Recent submissions

Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes ﻿

Weak Localisation and Scattering Mechanisms in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs Mesoscopic Wires ﻿

Layer Thickness and Composition Control for the Fabrication of High Efficiency Microcavity LED's ﻿

Magneto-Oscillations of the Gate Current in a Laterally Modulated Two-Dimensional Electron Gas ﻿

Elements of the Leakage Current of High-Epsilon Ferroelectric PZT Films ﻿

The Influence of Dopants on the Leakage Current in PZT Thin-Film Electroceramic Capacitors ﻿

Stress Relaxation in Al-Si-Cu Thin Films and Lines ﻿

Synthesis of CoxFe1-xSi2 with High-Dose Ion Implantation and Reactive Codeposition Epitaxy ﻿

Point defect reactions in silicon studied by in-situ high flux electron irradiation in a high voltage transmission electron microscope ﻿

Spectroscopic study of oxygen related lattice defects in annealed silicon ﻿

On the Determination of Two-Dimensional Carrier Distributions ﻿

Lateral and Vertical Dopant Profiling in Semiconductors by Atomic Force Microscopy Using Conducting Tips ﻿

Secondary Ion Mass Spectrometry ﻿

DUV Lithography for 0.35 µm CMOS Processing ﻿

High Field Magnetotransport in a Ga0.8In0.2As Quantum Well with a Parallel Si d-Layer ﻿

Low Temperature Anneal of the Divacancy in p-Type Silicon ﻿

Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon ﻿

Optical Circuitry for Data Transcription and Digital Logic Based on Photothyristor Differential Pairs ﻿

Recent Progress in a Low Cost Screen Printing Solar Cell Manufacturing Process ﻿

Ultrasmall waveguide bends: the corner mirrors of the future? ﻿