Recently added

Impact of the substrate quality on the low frequency noise of silicon diodes

Simoen, Eddy; Bosman, Gijs; Vanhellemont, Jan; Claeys, Cor (1994)

Multi Chip Modules

Roggen, Jean; Beyne, Eric (1994)

Optical Thyristor Based Stochastic Elementary Processor

Prémont, G.; Lalanne, P.; Chavel, P.; Heremans, Paul; Kuijk, Maarten (1994)

Development of an electroless copper deposition bath for via fill applications on TiN seed layers

Palmans, Roger; Maex, Karen (1994)

Creation and dissolution of oxygen related defects in czochralski grown silicon at high pressure - high temperatures

Misiuk, A.; Vanhellemont, Jan; Claeys, Cor; Hartwig, J.; Prieur, E.; Datsenko, L. Khrupa V.; Antonova, I. V.; Bak-Misuk, J. (1994)

Low-frequency noise sources in silicon-on-insulator depletion-mode p-MOSFETs

Lukyanchikova, N. B.; Petrichuk, M. V.; Garbar, N. P.; Simoen, Eddy; Claeys, Cor (1994)

Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers

Libezny, Milan; Caymax, Matty; Brablec, A.; Kubena, J.; Holy, V.; Poortmans, Jef; Nijs, Johan; Vanhellemont, Jan (1994)

Physico-chemical characterization of two kinds of tin dioxide sensor materials

Lenaerts, Silvia; Honoré, Mia; Huyberechts, Guido; Roggen, Jean; Maes, Guido (1994)

Optoelectronic Switch Operating with 0.2fJ/mm2 at 15 Mhz

Kuijk, Maarten; Heremans, Paul; Vounckx, Roger; Borghs, Gustaaf (1994)

The Completely Depleted PnpN Optoelectronic Switch

Heremans, Paul; Kuijk, Maarten; Vounckx, Roger; Borghs, Gustaaf (1994)

Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability

Groeseneken, Guido (1994)

Influence of an Electron Cyclotron Resonance Plasma on the Properties of YBa2Cu3O7-x Thin Films

François, Isabel; Borghs, Gustaaf (1994)

Recent Results from Imec on Hydrogen Passivation

El Gamel, Hussam; Nijs, Johan; Mertens, Robert (1994)

A complete analysis of planar microcavity structures including guided modes and reabsorption of light within the cavity

De Neve, Hans; Baets, Roel; Borghs, Gustaaf (1994)

In Situ Observation by RBS of Preferential Sputtering During Low Energy Ion Bombardment

De Coster, Walter; Brijs, Bert; Vandervorst, Wilfried (1994)

Epitaxial ferromagnetic (tMnAl/Co) and (Co/Al) multilayers on GaAs (001) grown by molecular beam epitaxy

De Boeck, Jo; Bruynseraede, Christophe; Bender, Hugo; Van Esch, Ann; Van Roy, Wim; Borghs, Gustaaf (1994)

Optimization of Reactive Ion Etching of Al0.48In0.52As in CH4/H2 and its Application to Dry Gate Recess of HEMT's

Carpi, Enio; Van Hove, Marleen; Van Rossum, Marc (1994)

RBS Analysis of Artefacts Induced by Low Energy Ion Sputtering

Brijs, Bert; De Coster, Walter; Bender, Hugo; Storm, Wolfgang; Osiceanu, Petre; Vandervorst, Wilfried (1994)

ARIBA, An All Round Ion Beam Acquisition Program

Brijs, Bert; De Coster, Walter; Deleu, Jeroen; Vandervorst, Wilfried; Wils, D.; Vandesteene, N. (1994)

Sputtering Phenomena of CoSi2 and TiSi2 under Low Energy Oxygen Bombardment

Brijs, Bert; De Coster, Walter; Vandervorst, Wilfried (1994)

Presentations: Recent submissions

Impact of the substrate quality on the low frequency noise of silicon diodes ﻿

Multi Chip Modules ﻿

Optical Thyristor Based Stochastic Elementary Processor ﻿

Development of an electroless copper deposition bath for via fill applications on TiN seed layers ﻿

Creation and dissolution of oxygen related defects in czochralski grown silicon at high pressure - high temperatures ﻿

Low-frequency noise sources in silicon-on-insulator depletion-mode p-MOSFETs ﻿

Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers ﻿

Physico-chemical characterization of two kinds of tin dioxide sensor materials ﻿

Optoelectronic Switch Operating with 0.2fJ/mm2 at 15 Mhz ﻿

The Completely Depleted PnpN Optoelectronic Switch ﻿

Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability ﻿

Influence of an Electron Cyclotron Resonance Plasma on the Properties of YBa2Cu3O7-x Thin Films ﻿

Recent Results from Imec on Hydrogen Passivation ﻿

A complete analysis of planar microcavity structures including guided modes and reabsorption of light within the cavity ﻿

In Situ Observation by RBS of Preferential Sputtering During Low Energy Ion Bombardment ﻿

Epitaxial ferromagnetic (tMnAl/Co) and (Co/Al) multilayers on GaAs (001) grown by molecular beam epitaxy ﻿

Optimization of Reactive Ion Etching of Al0.48In0.52As in CH4/H2 and its Application to Dry Gate Recess of HEMT's ﻿

RBS Analysis of Artefacts Induced by Low Energy Ion Sputtering ﻿

ARIBA, An All Round Ion Beam Acquisition Program ﻿

Sputtering Phenomena of CoSi2 and TiSi2 under Low Energy Oxygen Bombardment ﻿